With the new HOMMEL-ETAMIC surfscan, Jenoptik's industrial metrology division completes its range of products in the field of roughness and contour measurement. This digital measuring system combines two measuring instruments in one, so you can measure roughness and contours in one measurement, even on curved and oblique surfaces.
The HOMMEL-ETAMIC surfscan model from Jenoptik is a universal and flexible station for measuring roughness and contours. Given its performance, this device is an interesting alternative to conventional roughness and contour measuring systems equipped with a separate probing system.
This novelty was presented exclusively at the beginning of May 2014 at the Control trade fair in Stuttgart.
With its new probing system equipped with a high-definition digital scale, this measuring system offers a high and constant resolution of 6 or 12 nm over the entire vertical measuring range of 6/12 mm. It is therefore possible to measure the roughness with extreme precision over the entire measuring path. In addition, the vertical measuring range of up to 12 mm allows for a large number of contour measurements. In this context, we offer a wide range of probe arms.
The large measuring range considerably expands the application possibilities compared to conventional roughness probes and makes it possible, for example, to measure the roughness of curved surfaces, such as bearings, tooth flanks and ball screws. Even on oblique surfaces, for example seal seats, injection parts and many parts of the hydraulic industry, it is possible to combine measurements in a single operation. In terms of speed, the HOMMEL-ETAMIC surfscan also serves as a reference: when measuring roughness, time is no longer wasted in aligning the reference level, which saves a lot of time when measuring. configuration of the measurement because it is no longer necessary to align the device according to the part.
Convenient combination of measures
The device is also distinguished by other features that are not offered as standard in this category of instruments. For example, a magnetic coupling makes it possible to change the probe arms quickly and safely. Thanks to the electronic chip integrated into the arm, the system detects the probe arms and automatically configures them with the correct measurement parameters (eg calibration data, probing force). This prevents measurement errors. At the same time, the precise positioning of the probe arm makes it possible to automate measuring cycles, even on small parts and with small bores.
Modular expansion solutions
We offer various expansion solutions for the automation of measuring cycles and other specific measurements. It is thus possible to combine the measuring station with other probing systems in order to diversify the possibilities for measuring roughness and contours. One example is the digital wavecontour TM contour probe from Jenoptik, which increases the contour measurement range to 60 mm. If the surface structure does not allow for tactile measurement, an optical white light sensor can be added for inspection of the surface to enable non-contact optical measurement.
The device can also be used in the case of automation. In this case, modular axes take care of the automatic positioning as well as the search for the Y zenith. This method also makes it possible to measure the topography of surfaces with easy to configure X / Y dimensions, but also to measure cylindrical parts. using a rotational feed.
EVOVIS - Roughness and contour analysis software
The EVOVIS ™ analysis software represents the results of roughness and contour measurements on a uniform surface. Easy-to-understand pictograms as well as comprehensive support functions allow the user to tailor the powerful measurement and analysis possibilities to individual requirements. It is possible to group together several measurement tasks associated with different measurement conditions in the inspection plan relating to the part. This functionality allows you to keep an overview of all the characteristics to be checked, which are documented in a common report.
Find out more: www.jenoptik.com