Olympus' new Vanta iX production line XRF analyzer automates material analysis and alloy identification across the manufacturing chain, providing instant results that provide real-time process tracking and comprehensive inspection. Designed for uninterrupted operation, the analyzer simplifies quality controls specific to geological processes and metal processing. Metal manufacturing requires continuous process control to verify that products are made of the right alloy and avoid costly mixtures of materials. The Vanta iX analyzer provides a clear identification of material and nuance in a matter of seconds, so manufacturers can demonstrate that their products are 100% tested and verified. The device can provide rejection or acceptance results or a complete basic analysis of the material. In geological and mining processes, the analyzer allows for core scanning and conveyor belt analysis providing real-time results to monitor process variability and ensure uniform ore content.
Thanks to Olympus' proven silicon diffusion detector (SDD) and Axon Technology, the analyzer can test a wide range of alloys and metals, including lightweight elements. It provides the same high counting rate and stability as other Vanta devices.
Smart integration and modern data transfer
The Vanta iX analyzer is easy to install in manufacturing environments; simply use the attachment holes on either side of the device to assemble it on robotics and other systems.
The analyzer can be controlled with the Vanta Connect API or with an industrial programmable automaton (PLC) and a discrete cable.
Robustness adapted to the production line
Built to support the high levels of vibration, electromagnetic and acoustic noise, dust and humidity specific to the production facilities, the analyzer is tested for vibration resistance (MIL-STD-810G), rated IP54 and designed for continuous operation at temperatures ranging from 10 to 50 degrees Celsius.
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