Safety standards are becoming increasingly stringent, from one end of the manufacturing process to the other, particularly in the aerospace and automotive industries. Companies in all sectors, and particularly in these, who use X-ray computed tomography (CT) to carry out non-destructive testing of safety-critical components, are being asked to do more and more (sometimes in-house, of course) to demonstrate the veracity of their inspection results.
In particular, the condition of the digital detector has a considerable influence on the efficiency and accuracy with which indications and features are revealed and measured. It is therefore crucial to be able to evaluate and monitor the performance of this detector. To help users of X-ray TN systems to monitor the performance of their detectors throughout their lifetime, Nikon Metrology has launched this new easy-to-use, automated and fully functional monitoring kit, in full compliance with the internationally recognized ASTM E2737 standard.
The new ASTM E2737 Detector Performance Evaluation Kit is designed for the full range of Nikon Metrology systems: from dedicated metrology X-ray TN inspection systems to large-volume Large Envelope System (LES) systems. It is compatible with all X-ray sources offered by manufacturers, including rotating target technology and the world's only 450kV microfocus source, as well as the full range of industrial detectors.
The kit includes a pre-calibrated artifact known as a 5-groove wedge phantom, easy-to-use custom console mounting and quick-mount adapters so that the operator only needs to secure the assembly in position.
Dedicated software provides all the necessary functions, from artifact handling to image collection and data analysis. Reports are created quickly and automatically. Procedures run smoothly without operator intervention, and no longer require certification to ASTM E2737, or even full training in X-ray NT.
Nine detector parameters are useful for the data: spatial resolution, contrast sensitivity, material thickness range, signal-to-noise ratio, signal level, image latency, image afterglow, offset value and pixel maldistribution.
The detector's performance and long-term stability can be monitored throughout its lifetime, and its consistency compared with user-defined references, customizable thresholds and warnings. Results from the nine ASTM E2737 tests are recorded each time a series of measurements is carried out, and can be consulted at any time in tabular or graphical form for an overall view.
The process of image collection, automated processing and final report creation thanks to powerful trend analysis makes this ASTM E2737 tool unique in the industrial landscape.
Companies relying on computed tomography to control product quality and optimize production processes, as part of Industry 4.0 initiatives, can benefit from easy tracking of detector performance over time, in line with international standards.
Photo: light alloy version of Nikon Metrology's ASTM E2737 detector evaluation kit used in an X-ray TN system. Here, the phantom has been moved to the usual position of the manipulator, so as to be close to the digital detector and perform one of the nine tests, image persistence.
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