Tektronix has announced its first one-day online event, to be held on Wednesday, May 22, 2013 - aimed at engineers working in communications, IT, semiconductor, military/aerospace, consumer electronics, research or education, broadcast and other electronic test and measurement fields. This free virtual exhibition will cover the latest trends and innovations in test and measurement, and their application in practice. Presentations by experts will cover a wide range of sectors and applications in a series of webcasts followed by Q&A sessions and live chat, as well as a virtual trade show. Registration is now open at
The event will feature test and measurement tips and strategies to address growing industry trends to drive technology development, including:
- The growing challenge posed by wireless devices and how to design, debug and validate the various standards involved.
- How to deal with new optical and serial data bus architectures, which meet the demand for ever higher bandwidths.
- The explosion in new energy efficiency technologies and the growing demand for green energy solutions.
Webcasts will be held throughout the day (9 a.m. to 5 p.m., ECT) in the digital auditorium. In addition to the Tektronix and Keithley Instruments stand, delegates will be able to browse through virtual stands and chat with event sponsors - including CalPlus, CN Rood, Conrad, Distrelec/Elfa, Electrorent, Elektronik-Kontor, Farnell Element14, Giakova, RS Components and SJ Electronics.
Visitors will also be able to receive an electronic briefcase and take away/download the latest versions of manuals, application notes, how-to guides, etc., from both Tektronix and its sponsoring partners. The communications lounge will feature live chats, offering the chance to interact with other visitors, sponsors or industry experts.
The webcasts will be divided into two 45-minute webcast "streams" followed by live Q&A sessions:
Technology Webcasts
- Testing coherent transmission systems
- Next-generation high-speed designs
- Verification of simulation results in broadband designs
- Basic knowledge of electronics and high-power devices
- The NBTI (Negative Bias Temperature Instability) phenomenon: what is it and why is it important?
Application/solution-oriented webcasts
- Survey considerations for broadband applications
- Difficulties in testing new (power) semiconductors needed for energy-saving and green initiatives
- Low-power, low-level measurements for semiconductor design and verification
- Design, verification and optimization of radio integrated circuits for embedded system applications
- Power module characterization - challenges and solutions
- 100G/400G measurement problems
- Testing high-speed transmitters
- Testing high-speed serial data receivers
- Low-speed serial bus analysis for automotive and other applications
- TDR (Time Domain Reflectometry) for high-speed data applications
- Expertise in low-power, low-voltage and low-resistance measurement techniques for characterizing graphene and other nano-materials
- NBTI measurement methods and challenges
Learn more: www.tektronix.com/technologysymposium2013