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Image and surface analysis for microscopy and metrology

By Contrôles Essais Mesures
6 July 2021
in Measures
Reading time: 4 min
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Digital Surf announces the release of Mountains 9, a new version of its flagship software platform dedicated to image and surface analysis for microscopy and metrology.

Version 9 introduces a new branch of Mountains software, MountainsSpectral, for correlative and spectroscopic analysis, as well as new optional modules, new file formats and many other functions.

Professionals using 2D and 3D profilometry, scanning electron microscopy, near-field microscopy and spectroscopy in a wide range of applications will discover a wealth of new possibilities for image and surface analysis. 

"With the new version 9, Digital Surf expands the Mountains platform in two directions: full 3D data analysis and spectral analysis."explains Christophe Mignot, CEO of Digital Surf.

For 3D data analysis, the addition of free-form surface state parameters enables roughness to be calculated on non-planar parts of any type, even very complex shapes.

New spectral analysis functions provide solutions for correlative microscopy and the combination of chemical mapping and microscopic surface conditions. Full 3D views coupled with spectral mapping bring further benefits: multi-channel voxel cubes and I(V) spectroscopy data cubes can now be visualized and analyzed.

"These new types of data, as well as existing ones, are obviously interconnected. We are thus reinforcing the Mountains platform's position as the natural tool for the confluence and synergy of all microscopy data, from the simplest to the most sophisticated."says Christophe Mignot.

An extensive range

  • Since it was first marketed in 1997, the MountainsMap platform has become an international benchmark for surface analysis professionals in research and industry, with the majority of manufacturers supplying the software with their instruments.
  • In 2013, MountainsSEM leveraged the power and experience of the Mountains platform to bring 3D color and topography to scanning electron microscope users.
  • MountainsSPIP, launched in 2018 and incorporating the functionality of Image Metrology's SPIP software, has quickly been adopted by professionals working with atomic force microscopes and other local probe microscopes.
  • Now, with version 9, a new product family, MountainsSpectral, provides tools for correlative and spectral analysis.
  • MountainsLab, Digital Surf's multi-instrument solution, ushers in a new era, enabling data from virtually any surface-measuring instrument (profilometer or microscope) to be analyzed with the same software.

Three new modules also appear in version 9

  • Hull topography: for analyzing the condition of free-form surfaces (hulls)
  • Chemical cubes: visualize and analyze multichannel cubes of compositional data
  • IV spectroscopy: for SPM investigation of electrical surface properties, including 3D visualization of data cubes and individual IV curve analysis (including CITS data)

More data types supported

New data types that can be loaded via Mountains 9 include :

  • point clouds enabling users to visualize and analyze data from 3D digitizers, etc.
  • multi-channel cubes: to study the composition of materials in full 3D

New functions for all users

In addition to the new interface and modernized analysis tree, improvements have been made at all levels of the product:

  • an image comparison slider for quick comparison of different layers/images in the same dataset
  • a results calculator for calculating results directly in the Mountains interface
  • statistical tools are now available for all products, enabling them to manage large quantities of data.

A toolbox for microscopy and microanalysis

With the arrival of the MountainsSpectral product family, version 9 opens up new possibilities for the analysis of microscopy and spectroscopy data, in particular correlative analysis.

It is now possible to load multi-channel compositional data cubes, enabling users to combine tomography and chemical analysis.

Data from different sources (SEM, AFM, EDS/EDX etc.) can be brought together to form unique multi-layer datasets. A new color blending tool allows users to choose which data layers to bring to the foreground.

Electron microscope users can now create spectacular 3D renderings combining EDS/EDX maps or other spectral/compositional data with SEM images, or even reconstructed topography.

Visit the site:
www.digitalsurf.com

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