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Home Measures

Image and surface analysis for microscopy and metrology

By Contrôles Essais Mesures
July 6, 2021
in Measures
Reading time: 4 min
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Digital Surf announces the release of Mountains 9, a new version of its flagship software platform dedicated to image and surface analysis for microscopy and metrology.

This version 9 inaugurates a new branch of the Mountains software, MountainsSpectral, for correlative analysis and spectroscopy, as well as new optional modules, new file formats and many other functions.

Professionals using 2D and 3D profilometry, scanning electron microscopy, near-field microscopy and spectroscopy, in diverse and varied fields of application, will discover a wealth of new possibilities for image and surface analysis.

"With the new version 9, Digital Surf expands the Mountains platform in two directions: full 3D data analysis and spectral analysis,"explains Christophe Mignot, CEO of Digital Surf. "

For 3D data analysis, the addition of freeform surface state parameters allows you to calculate roughness on non-planar parts of any type, even very complex shapes.

The new spectral analysis functions provide solutions for correlative microscopy and the combination of chemical mapping and the state of microscopic surfaces. Integral 3D views coupled with spectral mapping bring other benefits: it is now possible to visualize and analyze multichannel voxel cubes and I(V) spectroscopy data cubes.

"These data of a new type, as well as those that already existed, are obviously interconnected. We are thus strengthening the position of the Mountains platform as the natural tool for the confluence and synergy of all microscopy data, from the simplest to the most sophisticated",says Christophe Mignot.

A wide range

  • Since its first commercialization in 1997, the MountainsMap platform has become an international reference for surface analysis professionals in research and industry, with the majority of manufacturers providing the software with their instruments.
  • In 2013, MountainsSEM relied on the power and experience of the Mountains platform to bring color and 3D topography to scanning electron microscope users.
  • MountainsSPIP, launched in 2018 and incorporating the functionality of Image Metrology's SPIP software, was quickly adopted by professionals working with atomic force microscopes and other local probe microscopes.
  • Now, with version 9, a new product family, MountainsSpectral, provides tools for correlative analysis and spectral analysis.
  • MountainsLab, Digital Surf's multi-instrument solution, is entering a new era, allowing data from virtually any surface measuring instrument (profilometer or microscope) to be analyzed with the same software.

Three new modules also appear in version 9

  • Shell topography: for the analysis of the condition of freeform surfaces (shells)
  • Chemical cubes: to visualize and analyze multichannel cubes of compositional data
  • IV spectroscopy: for SPM investigation of electrical surface properties, including 3D visualization of data cubes and individual analysis of the IV curve (including CITS data)

More supported data types

New data types that can be loaded through Mountains 9 include:

  • point clouds allowing users to visualize and analyze data from 3D digitizers, etc.
  • multichannel cubes: to study the composition of materials in integral 3D

New functions for all users

In addition to the new interface and modernized analysis tree, improvements have been made at all levels of the product:

  • an image comparison slider to quickly compare different layers/images in the same data set
  • a results calculator to calculate the results directly in the Mountains interface
  • statistical tools are now available with all products, allowing large amounts of data to be managed.

A toolkit for microscopy and microanalysis

With the arrival of the MountainsSpectral family of products, version 9 opens up new possibilities for the analysis of microscopy and spectroscopy data, in particular correlative analysis.

It is now possible to load multichannel cubes of compositional data, allowing users to combine tomography and chemical analysis.

Data from different sources (SEM, AFM, EDS/EDX etc.) can be brought together to form single multilayer datasets. A new color mixing tool allows users to choose which data layers to bring to the foreground.

Electron microscope users can now create spectacular 3D renderings that combine EDS/EDX maps or other spectral/compositional data with MEB images or even reconstructed topography.

Visit:
www.digitalsurf.com

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