Kit media
Specialist in nanometrology, LNE has been developing for more than ten years an expertise dedicated to the characterization of nanomaterials. On the occasion of World Metrology Day, which this year has as its theme "Metrology in the digital age", LNE presents the NanoMetrologIA platform: a tool it has developed to measure the dimensional properties of nanoparticles using artificial intelligence.
The adoption of digital technology is revolutionizing metrology by improving processes and opening up new perspectives. This is particularly the case for the characterization of nano-objects, and more particularly nanoparticles.
The characterization of nanoparticles is essential to support any sustainable innovation in the industrial field. Their properties are related to the different performances sought. The regulatory framework put in place in recent years imposes specific requirements in order to meet the public health challenge.
In this context, the characterization of nanomaterials is essential for industry. To this end, the LNE has developed the NanometrologIA platform, which is a step forward to support the deployment of nanomaterials in a serene and sustainable environment.
In practice, the measurement of the size of nanoparticles is based on multiple images obtained by electron microscopy that make it possible to produce a statistical distribution of the diameters of the nanoparticles.
Conventional methods, mainly manual, require several hours of processing and only work on particles whose entire contour is visible in the image. They do not make it possible to discern particles in the form of aggregates or in the form of agglomerates where they can be partially masked.
Accelerating the measurement of nanoparticles
To improve analysis and reduce image processing time, LNE has developed an algorithm based on deep learning from a dedicated database. The technique used makes it possible on the one hand to automatically identify all the isolated or aggregated /agglomerated particles, and on the other hand, to reconstruct the contour of each particle. Thanks to the NanoMetrologIA platform, measuring the size distribution of nanoparticles now requires only a few seconds.
The platform is now used mainly for the identification of TiO2 titanium dioxide nanoparticles, widely used in many applications, including the additive E171 in the food industry now banned. Work continues to enrich the algorithm training database by incorporating images presenting particles of different chemical composition: SiO2, NaCl, Fe, Au, Ag.
World Metrology Day
World Metrology Day is an annual event where more than 80 countries celebrate the impact of measurements in our daily lives. The date of May 20 was chosen to commemorate the signing of the Metre Convention on May 20, 1875, marking the beginning of official international collaboration in the field of metrology. The international metrology community, which aims to ensure the accuracy of measurements made around the world, strives on each World Metrology Day to raise awareness of metrology through posters and a website.
