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Digital Surf announces version 7 of its Mountains software for image analysis and surface metrology. At the cutting edge of imaging, the new 3D version is compatible with OpenGL and Direct3D and allows you to visualize every detail of the surfaces at the micrometer or nanometer scale.
- In addition to improving existing solutions for 3D optical microscopes, near-field microscopes and profilometers, Mountains 7 now offers:
MountainsMap SEM module for scanning electron microscopes. It incorporates 3D reconstruction of topography (x, y and z in length units) from pairs of stereo images, anaglyphs and series of 4 images.
The MountainsMap Hyperspectral module for Raman and FT-IR spectrometers. It allows you to manipulate spectra and hypercubes interactively, filter them, generate density maps for composition, and visualize "flattened" hypercubes in 3D. - Completely redesigned user interface to make it even faster and easier to create metrological analysis reports.
All imaging, analysis and editing functions are accessible in logical order thanks to their classification into groups where the most important functions appear first.
Enriched and illustrated info-bubbles allow you to immediately understand all the functions.
Each step of the analysis is easily identifiable in the hierarchical analysis tree thanks to the clear preview of the data and the existence of separate icons categorized by type.
Each operator is represented independently in the analysis tree, allowing the settings associated with it to be changed on the fly. - Results manager that collects all the metrological data obtained.
The ability to set tolerances and automatic display of "Accepted"/"Refused" statuses (Pass/Fail)
The layers of multilayered files (measured with multichannel 3D optical microscopes and near-field microscopes) can be easily identified and selected with their miniature icons that provide insight into each layer. Mountains 7 provides local mapping of surface properties and automatic removal of outliers on surfaces measured by 3D optical microscopes. - Compatibility with the most common Office tools: Excel, PDF, RTF (Word), bitmap from 96 dpi to 1200 dpi
- Improvements to the colocation between images and surface measurements from one or more sources. For example, IT is possible to co-locate MEB images from different detectors (backscattered and secondary electrons), images of microscopes or spectrometer density maps with surface topographies from 3D optical microscopes, near-field microscopes and 3D profileometers.
Find out more: www.digitalsurf.com
