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Nikon Metrology organizes a technical day on tomography. It will take place at the company's premises (91) on Tuesday, February 10, 2015 from 9 a.m. to 4 p.m. The forecast program is as follows:
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General presentation of Nikon Metrology
Electronic component inspection systems by X-ray and digital tomography. Solutions for all applications
Digital tomography metrology
High-power systems: X-ray source microfocus 450/750 KV unique in the world for non-destructive inspection and measurement of massive parts with unprecedented accuracy.
Presentation of what's new
X-tract, a new software module for a more detailed overview of multilayered circuit boards and complex electronic components.
Inspect-x 4: allows intuitive inspection of circuit boards, components or electrical appliances in an automated non-destructive process.
Customer applications
Buffet
Workshops and demonstrations on XTH225 / XTV160 machines
Mandatory registration by February 3 by the link below
Find out more: https://www.nikonmetrology.com/fr_EU/Events/European-Events-Calendar/Journee-Technique-Tomographie
