Take part in the second CT scan conference organized by Nikon Metrology

In recent years, x-ray and digital tomography inspection systems have developed strongly because they allow non-destructive inspection of electronic components and industrial parts, but also to increase productivity. Following the success of the first edition, Nikon Metrology is pleased to invite you to the^2nd tomography conference on Thursday, February 18th in Evry. As a major player in this field, the company will offer you all its expertise at this conference.

PROGRAM

8:45 a.m. - Participants welcome and check-in
-9:00 a.m. - Introduction
-9:15 a.m. - Benefits of digital tomography inspection in additive (mainly metal) manufacturing. Mr. Yannick Loisance, Multistation
-10:15 a.m. - Automation of digital tomography inspection to improve productivity. Mr. Loïc Marquet, Nikon Metrology
-11:15 a.m. - Demonstration on the XTH 225 system (inspection of industrial parts)
 
-12:15 p.m. - Lunch
-1:30 p.m. - Problems related to electronic card testing: analysis of X-ray/ultra-sound failures, thermo...Ms Diane ECOIFFIER, Insidix
-2:30 p.m. - Laminography: for a 3D visualization of electronic maps, Speaker at Nikon Metrology UK's Centre of Excellence
-3:30 p.m. - Demonstration on the XTV 160 system (inspection of electronic components)

Each intervention will be followed by a sequence of questions/answers.

Find out more: https://www.nikonmetrology.com/fr_EU/Events/European-Events-Calendar/18-Fevrier-2eme-conference-de-tomographie-de-Nikon-Metrology