In recent years, x-ray and computed tomography inspection systems have become increasingly popular, enabling non-destructive inspection of electronic components and industrial parts, as well as boosting productivity. Following on from the success of the first edition, Nikon Metrology is pleased to invite you to the 2nd edition of this event.e tomography conference on Thursday February 18 in Evry. As a major player in this field, the company will offer you all its expertise at this conference.
- 08:45 - Welcome and registration
-9:00 am - Introduction
-9:15 am - Advantages of computed tomography inspection in additive manufacturing (mainly metal). Mr Yannick Loisance, Multistation
-10:15 am - Automating CT inspection to improve productivity. Mr Loïc Marquet, Nikon Metrology
-11:15 a.m. - Demonstration of the XTH 225 system (industrial parts inspection)
-12:15pm - Lunch
-13:30 - Issues related to electronic board testing: failure analysis X-ray/ultrasound, thermo... Ms Diane ECOIFFIER, Insidix
-2.30 pm - Laminography: for 3D visualization of electronic boards, speaker at Nikon Metrology UK's Center of Excellence
-15:30 - Demonstration of the XTV 160 system (inspection of electronic components)
Each presentation will be followed by a question and answer session.