Jenoptik and CM Adour are organizing a measurement technology day on June 16 in Pau (64) starting at 8:30 a.m.
The program will be given lectures and presentations of materials. Topics include:
- measures of roughness, shape and contour
- Hommel-Etamic pneumatic dimensional measurement
- optical dimensional measurement
- the look-and-side control by vision
- roundtable of the day
The day ends at 16:15. Lunch on site is offered subject to pre-booking at the time of registration.
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