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Home Measures

Measurement Technology Day organized by Jenoptik and CM Adour

By Contrôles Essais Mesures
April 12, 2016
in Measures
Reading time: 1 min
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Jenoptik and CM Adour are organizing a measurement technology day on June 16 in Pau (64) starting at 8:30 a.m.

The program will be given lectures and presentations of materials. Topics include:

  • measures of roughness, shape and contour
  • Hommel-Etamic pneumatic dimensional measurement
  • optical dimensional measurement
  • the look-and-side control by vision
  • roundtable of the day

The day ends at 16:15. Lunch on site is offered subject to pre-booking at the time of registration.

Find out more:

 

 

 

Labels: Market Info
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