Marie-Christine Lépy and Gaël Obein, winners of the 2019 LNE Research Prize

Created in 2009, the LNE Research Prize aims to reward researchers contributing to the success and scientific reputation of the French National Metrology Network, which it manages, and of its own research activity. This eleventh edition will honor on Monday December 9, Marie-Christine Lépy and Gaël Obein for their respective work on ionizing radiation and optical radiation.
Marie-Christine Lépy is research director at the French Atomic Energy and Alternative Energies Commission. In 1982 she defended her thesis at the University of Caen and obtained a doctorate in nuclear physics. As a result, in December 1984, she joined the National Henri Becquerel Laboratory (LNE-LNHB / CEA) in the gamma spectrometry group.
Since 2005, Marie-Christine Lépy has been coordinating the Working Group on gamma spectrometry of the International Committee for Radionuclide Metrology (ICRM) and has been a member of the advisory committee of the European Conference on X Spectrometry (EXRS) since 2006. In 2009 she was appointed “Senior Expert” at the CEA and then supported the same year for his Habilitation to supervise Research at Pierre and Marie Curie University.
Research Director since January 2014, Marie-Christine Lépy is currently responsible for gamma and X-ray spectrometry within the LNHB. His skills in radionuclide metrology today cover measurement by gamma and X spectrometry, the development of X spectrometry and the use of tunable monochromatic sources, and the use of radiation on the line of the Sun synchrotron. She regularly cooperates with national metrology laboratories in the field of radioactivity and has published more than 80 articles in international peer-reviewed journals.
Gaël Obein is a lecturer at the National Conservatory of Arts and Crafts. In 2003 he defended his thesis entitled "Optical and visual characterization of shine", carried out at the National Museum of Natural History and became a doctor in physical systems and metrology. After a postdoctoral fellowship at NIST in the “Optical Thermometry and Spectral Methods” division, he joined Cnam in 2006 where he set up and developed appearance metrology within the LNE-LCM / Cnam joint metrology laboratory.
Since 2012, he has been leading European metrology on this theme through the 3 JRPs that he coordinates (xDReflect, BiRD, BxDiff). Gaël Obein has been in charge of producing and updating the national references for Photometry and spectrophotometry at LNE-LCM since 2008. Since 2017, he has also been president of CIE-France, the national mirror committee of the International Commission for Lighting (CIE) and is upstream manager of the Photonics department at LNE-LCM / Cnam since 2018.
He now heads two technical committees at the CIE, one on bidirectional reflectance measurement, the other on gloss measurement. In November 2018, Gaël Obein defended his Habilitation to supervise research entitled "Metrology of appearance" at Cnam.

Find out more: www.lne.fr