The LNE Research Award was created in 2009 to reward researchers who have contributed to the success and scientific reputation of the French National Metrology Network, which it manages, and of its own research activities. On Monday 9 December, Marie-Christine Lépy and Gaël Obein will be honoured for their work on ionizing radiation and optical radiation respectively.
Marie-Christine Lépy is a research director at the Commissariat à l'énergie atomique et aux énergies alternatives. In 1982 she defended her thesis at the University of Caen and became a doctor in nuclear physics. She then joined the Laboratoire National Henri Becquerel (LNE-LNHB/CEA) in December 1984 in the gamma spectrometry group.
Since 2005, Marie-Christine Lépy coordinates the Working Group on Gamma Spectrometry of the International Committee for Radionuclide Metrology (ICRM) and is a member of the Advisory Committee of the European Conference on X-ray Spectrometry (EXRS) since 2006. In 2009 she was appointed "Senior Expert" at the CEA, and the same year she obtained her Habilitation to direct research at the University Pierre et Marie Curie.
Research Director since January 2014, Marie-Christine Lépy is currently in charge of gamma and X-ray spectrometry at the LNHB. Her expertise in radionuclide metrology now covers measurement by gamma and X-ray spectrometry, the development of X-ray spectrometry and the use of tunable monochromatic sources, and the use of line radiation from the Soleil synchrotron. It cooperates regularly with NMIs in the field of radioactivity and has published more than 80 papers in international peer-reviewed journals.
Gaël Obein is a lecturer at the Conservatoire National des Arts et Métiers. In 2003 he defended his thesis entitled "Optical and visual characterization of gloss", carried out at the Muséum National d'Histoire Naturelle and became a doctor in Physical Systems and Metrology. After a postdoctoral fellowship at NIST in the Optical Thermometry and Spectral Methods division, he joined Cnam in 2006 where he set up and developed appearance metrology in the LNE-LCM/Cnam joint metrology laboratory.
Since 2012, he leads the European metrology on this topic through the 3 JRP he coordinates (xDReflect, BiRD, BxDiff). Gaël Obein is in charge of the realization and maintenance of the national references of Photometry and Spectrophotometry of LNE-LCM since 2008. Since 2017, he has also been president of CIE-France, the national mirror committee of the Commission Internationale de l'Eclairage (CIE), and has been upstream manager of the Photonics Department at LNE-LCM/Cnam since 2018.
He now leads two technical committees at the CIE, one on bidirectional reflectance measurement, the other on gloss measurement. In November 2018, Gaël Obein defended his Habilitation to direct research entitled "Metrology of appearance" at the Cnam.
Optimized flow sensors for heat pumps
Flow sensors for energy-efficient heat pumps must be able to measure even small flows. The German company Sika, manufacturer of sensors for energy-efficient...