Micro-Epsilon's new multi-peak models now enable highly accurate detection of transparent layers. Depending on the controller model, calculations are made from the respective distance values, taking refractive indices into account. The thickness measurement system does not perform distance measurements, but measures the thickness of individual layers and their combinations. In addition to the multi-point versions, a further optimization has been achieved. For industrial use, the interferometers are now equipped with new sensor housings with a higher IP65 protection rating.
The IMS5400-DS interferometer enables highly accurate distance measurements in industrial applications. It also enables stable measurement of step profiles. Thanks to absolute distance measurement, the scanning of height differences is carried out with maximum signal stability and accuracy. When measuring moving objects, differences in heel level, gradients and cavities can be reliably detected without additional referencing.
The IMS5400-TH interferometer is ideal for precise thickness measurement, even in industrial applications. Its wide thickness measurement range enables it to measure thin films, flat glass and foils. The white-light interferometer, which operates in the near-infrared range, can also be used to measure the thickness of anti-reflective coated glass.
Finally, the IMS5600-DS interferometer is suitable for distance measurements, with resolutions of the order of a few picometers. Thanks to absolute measurement, scanning is performed without signal loss. When measuring moving objects, level differences in heels, slopes and cavities can be reliably detected. The measuring system offers sub-nanometer resolution with a large base distance to the measuring range.
In addition to their outstanding linearity, Micro-Epsilon white-light interferometers offer resolution down to < 30 picometers. They are easily configured via a web interface.