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Micro-Epsilon's new multi-peak models now make it possible to detect transparent layers with high accuracy. According to the controller model, calculations are made from the respective distance values while taking into account the refractive indices. The thickness measurement system does not perform distance measurements, it measures the thickness of the different layers and their combinations. In addition to the multipoint versions, another optimization has been carried out. For industrial use, interferometers are now equipped with new sensor housings with a higher IP65 protection rating.
The IMS5400-DS interferometer enables highly accurate distance measurements in industrial applications. It also allows the stable measurement of step profiles. Thanks to the absolute measurement of distances, the scanning of elevation differences is carried out with maximum signal stability and accuracy. When measuring moving objects, differences in the level of heels, elevations and cavities can thus be reliably detected without additional referencing.
The IMS5400-TH interferometer is suitable for accurate thickness measurement, also in industrial applications. The wide thickness measuring range makes it possible to measure thin films, flat glass and sheets. The white light interferometer, which works in the near infrared, also makes it possible to measure the thickness of the anti-reflective coating glass.
Finally, the IMS5600-DS interferometer is suitable for distance measurements, with resolutions of the order of a few picometers. Thanks to the absolute measurement, the scan is carried out without signal loss. When measuring moving objects, differences in the level of heels, elevations and cavities can be reliably detected. The measuring system offers subnanometric resolution with a large base distance from the measuring range.
In addition to their exceptional linearity, Micro-Epsilon's white light interferometers offer a resolution of up to < 30 picomètres. La configuration s’effectue de manière simple via une interface web.
