Nikon Metrology is organizing a technical day on tomography. It will take place on the company's premises (91) on Tuesday February 10, 2015 from 9am to 4pm. The provisional program is as follows:
– Accueil
– Présentation générale de Nikon Metrology
- X-ray and digital tomography inspection systems for electronic components. Solutions for every application
– La métrologie par tomographie numérique
- High-power systems: the world's only microfocus 450/750 KV X-ray source for non-destructive inspection and measurement of massive parts with unprecedented precision.
– présentation des nouveautés
X-tractnew software module for a more detailed overview of multilayer PCB assemblies and complex electronic components.
Inspect-x 4 The new, intuitive inspection system for printed circuit boards, components or electrical devices in an automated, non-destructive process.
– Cas d’applications clients
– Buffet
– Ateliers et démonstrations sur les machines XTH225 / XTV160
Registration required by February 3 via the link below
Learn more: https://www.nikonmetrology.com/fr_EU/Events/European-Events-Calendar/Journee-Technique-Tomographie
