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Insidix and Nikon are organizing a workshop to discover the latest developments in micro-analysis technologies for electronic components and boards: 2D and 3D optics, SEM, 2D and 3D X-rays, thermal, ultrasound and thermomechanics.
This technical day will take place on Tuesday February 4, 2020 in the premises of the Insidix company, 14 rue Henri Dunant, 38180 Seyssins.
Program :
- 9h00: Welcome of the participants
- 9:30 am - 10:30 am: Advanced expertise for the rapid localization of internal faults
- 11h00 - 12h00: Shop floor 4.0 in Computed Tomography: New paradigm shift
- 12:30 p.m .: Lunch
- 2 p.m.-3 p.m.: Scanning electron microscopy, the transition from optics to electronic imaging and chemical analysis in a fluid manner
The Nexiv by Nikon range: '' The fast and automatic solution for high precision measurements ''
9:30 am - 4:00 pm: Free access to the demonstration room on all equipment
To register :
https://www.nikonmetrology.com/en/index.php?option=com_content&view=article&id=463
