Media kit
Digital Surf announces version 7 of its Mountains software for image analysis and surface metrology. At the cutting edge of imaging, the new 3D version is compatible with OpenGL and Direct3D, and visualizes every surface detail down to the micrometer or nanometer scale.
- In addition to enhancing existing solutions for 3D optical microscopes, near-field microscopes and profilometers, Mountains 7 now offers :
- the MountainsMap SEM module for scanning electron microscopes. This integrates 3D reconstruction of topography (x, y and z in units of length) from pairs of stereo images, anaglyphs and series of 4 images.
- the MountainsMap Hyperspectral module for Raman and FT-IR spectrometers. It enables spectra and hypercubes to be manipulated interactively, filtered, density maps of composition to be generated, and "flattened" hypercubes to be visualized in 3D. - Completely redesigned user interface, for even faster and easier creation of metrological analysis reports.
- All imaging, analysis and editing functions are available in a logical order, arranged in groups with the most important functions appearing first.
- Enriched, illustrated tooltips provide an immediate understanding of all functions.
- Each stage of the analysis is easily identifiable in the hierarchical analysis tree, thanks to clear data previews and distinct icons classified by type.
- Each operator is represented independently in the analysis tree, allowing you to modify the associated settings on the fly. - Results manager for all metrological data obtained.
- Possibility of defining tolerances and automatic display of "Accepted"/"Rejected" status (Pass/Fail)
- Layers in multi-layer files (measured with multi-channel 3D optical microscopes and near-field microscopes) can be easily identified and selected thanks to their miniature icons, which provide an overview of each layer. Mountains 7 provides local mapping of surface properties and automatic removal of outliers from surfaces measured by 3D optical microscopes. - Compatible with the most common Office tools: Excel, PDF, RTF (Word), bitmap from 96 dpi to 1200 dpi
- Improvements in collocation between images and surface measurements from one or more sources. For example, it is now possible to collocate SEM images from different detectors (backscattered and secondary electrons), microscope images or spectrometer density maps with surface topographies from 3D optical microscopes, near-field microscopes and 3D profilometers.
Learn more: www.digitalsurf.com
