Tektronix has announced its first one-day online event, to be held on Wednesday, May 22, 2013 - for engineers working in communications, computing, semiconductors, military/aerospace, consumer electronics, research or education, broadcasting and other areas of electronic testing and measurement. This free virtual show will cover the latest trends and innovations in testing and measurement, as well as their application in practice. The presentations, delivered by experts, will cover a wide range of sectors and applications as part of a series of webcasts followed by question and answer sessions and live chat, as well as a virtual trade show. Registrations are open now on the website
The event will feature testing and measurement tips and strategies to respond to growing industry trends in boosting technological development, including:
- The growing challenge posed by wireless devices and how to design, debug and validate the various standards associated with them.
- The way to apprehend the new optical and series data bus architectures, which meet the demand for ever higher bandwidth.
- The explosion of new energy efficiency technologies and the growing demand for green energy solutions.
Webcasts will be held throughout the day (9 a.m. to 5 p.m., ECT) in the digital auditorium. In addition to the Tektronix and Keithley Instruments booth, delegates will be able to navigate through the virtual booths and chat with event sponsors including CalPlus, CN Rood, Conrad, Distrelec/Elfa, Electrorent, Elektronik-Kontor, Farnell Element14, Giakova, RS Components and SJ Electronics.
Visitors will also be able to receive an electronic briefcase and take away/download the latest versions of the manuals, application notes, practical guides, etc., both from Tektronix and its sponsoring partners. The communications lounge will feature live chats and the opportunity to interact with other visitors, sponsors or industry experts.
The webcasts will be divided into two 45-minute webcasts followed by live question and answer sessions:
- Testing in consistent transmission systems
- Next-generation high speed series designs
- Checking simulation results in broadband designs
- Basics of high-powered electronics and devices
- The NBTI (Negative Bias Temperature Instability) phenomenon: what is it and why does it matter?
- Survey considerations for broadband applications
- Difficulties in testing new (power) semiconductors needed for energy-saving initiatives and green initiatives
- Low-power, low-level measures for semiconductor design and verification
- Design, verification and optimization of integrated radio circuits for embedded system applications
- Characterization of power modules - challenges and solutions
- 100G/400G measurement problems
- High speed series transmitter tests
- High speed series data receiver testing
- Low-speed series bus analysis for automotive and other application areas
- TDR (time domain reflectometry) for high-speed data applications
- Mastery of low-power, low voltage and low-strength measurement techniques for the characterization of graphene and other nano-materials
- Measurement methods and challenges of the NBTI phenomenon
Read more: www.tektronix.com/technologysymposium2013