Olympus has teamed up with experts to create a collaborative knowledge platform offering digital content dedicated to advanced optical metrology, providing a valuable resource for researchers in the field of optical metrology and industrial microscopy. Constantly updated, this platform of specialized documents was created in collaboration with leading experts from academia and industry. Researchers will be able to consult it to feed their work, find out about new advances in the field and learn more about the nuts and bolts of publishing scientific articles.
To meet the need for up-to-date content from experts in the field, Olympus has created a collaborative knowledge platform offering digital content dedicated to advanced optical metrology (Advanced Optical Metrology Hub) in partnership with Wiley, an American publishing house specializing in the publication of scientific journals, technical, academic and encyclopedic works. This platform brings together the best in industrial microscopy, scientific publishing and academic and industrial expertise. This new initiative is part of Olympus' commitment to building bridges with centers of excellence in microscopy to enhance and foster dialogue between basic research and industrial applications.
The eBooks hosted on this platform are an excellent way for researchers to access reliable, relevant and up-to-date content that benefits the advancement of their work. Researchers can also collaborate on the platform themselves, enabling them to broaden the scope of their work and learn more about the process surrounding the publication of scientific articles.
The first digital book published on the platform features articles on additive manufacturing, focusing in particular on electron beam melting, stereolithography and laser-assisted crystallization. The book's core content comes from the Olympus Links collaborative network of European industrial and academic centers of excellence. Digital books on thin films, sensors, roughness, power and electronic components will be added to the platform in the near future.
Commenting on the launch, Markus Fabich, strategic marketing manager for the industrial microscopy sector at Olympus, said: "This is a great new resource for researchers to both enrich their knowledge and make a contribution. These e-books will provide practical, concise overviews of the latest developments in metrology for a specific field of application, making them a valuable resource for both academia and industry."
As the world leader in microscopy, Olympus has been supplying microscope systems to industrial markets for over 100 years. Olympus systems offer the precision and reliability required for a wide range of applications in academic research, product development, quality control and in-service inspection. The Olympus product range for industrial microscopy includes optical, digital, confocal and stereomicroscopes, as well as cameras and software.
John Wiley & Sons, Inc. is an American publisher of scientific, technical, academic and encyclopedic journals. The company has acquired expertise in the field of microscopy, notably through its "Microscopy and Analysis" platform and other publications such as the scientific journal Journal of Microscopypeer-reviewed.
The "Advanced Optical Metrology Hub" collaborative knowledge platform is available at www.advancedopticalmetrology.com
For more information on Olympus products and services, please visit our website at www.olympus-ims.com